| 000 | 00735nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 220419s9999 xx 000 0 und d | ||
| 040 | _cJayakar Knowledge Resource Center | ||
| 100 |
_aRailkar, Tarak A _eResearcher _910912 |
||
| 245 | 0 |
_cRailkar, Tarak A _aDevelopment of Thermally Stimulated Exoelectron Emission (TSEE) technique for the detection and characterisation of surface and interface defects in silicon (Si) and gallium arsenide (GaAs) |
|
| 260 |
_c1994 _aPune _bSavitribai Phule Pune University |
||
| 653 | _aSemiconductors||Gamma irradiation||Gallium arsenide||Exoemission||Polycrystalline | ||
| 700 |
_aBhoraskar, S V _eGuide _910913 |
||
| 856 | _uhttp://lib.unipune.ac.in:8080/xmlui/handle/123456789/1086 | ||
| 942 | _c5 | ||
| 999 |
_c406075 _d406075 |
||