| 000 | 00633nam a2200145Ia 4500 | ||
|---|---|---|---|
| 008 | 220419s9999 xx 000 0 und d | ||
| 040 | _cJayakar Knowledge Resource Center | ||
| 100 |
_aWalunj, A K _eResearcher _97869 |
||
| 245 | 0 |
_cWalunj, A K _aImprovement of quality and reliability of electronic circuits at design stage using Taguchi method |
|
| 260 |
_c2007 _aPune _bSavitribai Phule Pune University |
||
| 653 | _aCircuit reliability||Taguchi method||Anova||Bjt degradation||Robust circuit design | ||
| 700 |
_aShaligram, A D _eGuide _97870 |
||
| 856 | _uhttp://lib.unipune.ac.in:8080/xmlui/handle/123456789/1109 | ||
| 942 | _c5 | ||
| 999 |
_c403920 _d403920 |
||