000 00488nam a2200157Ia 4500
008 211231s9999 xx 000 0 und d
020 _a81-203-2214-2
040 _cJayakar Knowledge Resource Centre
100 _aChakraborty, Kanad
245 0 _aFault-tolerance and reliability techniques for high-density random-access memories
250 _a1st
260 _bPrentice-Hall
_aNew Delhi
_c2002
300 _axix,426p p.
653 _aRandom access memory - Reliability
942 _c1
999 _c295741
_d295741