Hall, Patrick <br/><br/>
Machine learning for high-risk applications: approaches to responsible AI 

 - 1st 
 - New Mumbai  Shroff Publishers and Distributors Pvt Ltd  2023 
 - xxi, 438 p. 
<br/><br/><label>ISBN: </label>9789355429728 
<br/><br/><label>Dewey Class. No.: </label>006.31  / HAL.P