Railkar, Tarak A  <br/><br/>
Development of Thermally Stimulated Exoelectron Emission (TSEE) technique for the detection and characterisation of surface and interface defects in silicon (Si) and gallium arsenide (GaAs) 
Railkar, Tarak A  
 - Pune  Savitribai Phule Pune University  1994 
<br/><br/><label>Subjects--Index Terms: </label>Semiconductors||Gamma irradiation||Gallium arsenide||Exoemission||Polycrystalline