Chakraborty, Kanad <br/><br/>
Fault-tolerance and reliability techniques for high-density random-access memories 

 - 1st 
 - New Delhi  Prentice-Hall  2002 
 - xix,426p p. 
<br/><br/><label>ISBN: </label>81-203-2214-2 
<br/><br/><label>Subjects--Index Terms: </label>Random access memory - Reliability