Design and development of scanning force microscopic techniques for surface characterization Patil, Shivprasad V
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TextPublication details: Pune Savitribai Phule Pune University 2002Subject(s): Atomic force microscopy||Dynamic mode||Cantilevers||Electrostatic force||Force curve measurementOnline resources: Click here to access online
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| Thesis | Jayakar Knowledge Resource Centre | Jayakar Knowledge Resource Centre | Available |
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