Savitribai Phule Pune University, Pune

Jayakar Knowledge Resource Centre

Fault-tolerance and reliability techniques for high-density random-access memories

By: Chakraborty, KanadMaterial type: TextTextPublication details: New Delhi Prentice-Hall 2002Edition: 1stDescription: xix,426p pISBN: 81-203-2214-2Subject(s): Random access memory - Reliability
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Books Jayakar Knowledge Resource Centre
Jayakar Knowledge Resource Centre
EL142 P02 (Browse shelf(Opens below)) Available 422668
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